For
many chipmakers engaged in 200mm wafer production, throughput
is the single most important
factor with regard to wafer probing.
The Horizon 4090µ Fast Probe is designed to meet the
need for speed, delivering the shortest 200 mm wafer probing
stepping times available.
With
Horizon 4090µ Fast
Probe, you can:
Increase manufacturing
throughput and productivity.
Reduce
cost-of-ownership for applications that require short test
times or testing of large numbers of die per wafer.
Achieve
40-50 percent gain in system throughput and manufacturing
for low cost, commodity-type devices.
